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作者:

Qin, Fei (Qin, Fei.) (学者:秦飞) | Yan, Dongmei (Yan, Dongmei.)

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EI Scopus SCIE

摘要:

Development of magnetism,based nondestructive testing technology and the Microelectronic mechanical system require accurate computation of perturbed magnetic fields generated by mechanical stress. In this paper based on the linearized magnetoelastic theory, the governing equations and continuity conditions to determine the perturbed magnetic fields were formulated for the case of weak external magnetic fields such as the earth's magnetic,field. Under those weak magnetic fields, the effect of the magnetic fields on mechanical deformation was neglected. As a result, the interaction between the deformation and the magnetic field was simplified. The effect of deformation on the perturbed magnetic field was taken into account by introducing the displacement gradient into the boundary conditions that the perturbed field should-satisfy. As examples, analytic solutions of the perturbed magnetic field of infinite plates with and without a round hole, which are subjected to tensile stresses and weak external magnetic fields, were obtained by the approach presented. The results show that the perturbed magnetic fields induced by stress are three orders less in magnitude of intensity than that of magnetic fields without stress, and some prominent local features such as that has more peaks and decays more rapidly in the radial direction than the, case of stress free that are predicted by the solutions.

关键词:

magnetic fields magnetoelasticity perturbed stress

作者机构:

  • [ 1 ] [Qin, Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100022, Peoples R China
  • [ 2 ] [Yan, Dongmei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100022, Peoples R China

通讯作者信息:

  • 秦飞

    [Qin, Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100022, Peoples R China

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来源 :

JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME

ISSN: 0021-8936

年份: 2008

期: 3

卷: 75

2 . 6 0 0

JCR@2022

ESI学科: ENGINEERING;

JCR分区:3

被引次数:

WoS核心集被引频次: 1

SCOPUS被引频次: 4

ESI高被引论文在榜: 0 展开所有

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