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作者:

Wang, Y. (Wang, Y..) | Mei, Z. X. (Mei, Z. X..) | Yuan, H. T. (Yuan, H. T..) | Du, X. L. (Du, X. L..) (学者:杜修力) | Zou, J. (Zou, J..) | Jia, J. F. (Jia, J. F..) (学者:贾俊峰) | Xue, Q. K. (Xue, Q. K..) | Zhang, Z. (Zhang, Z..)

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EI Scopus SCIE

摘要:

An improved MBE-grown ZnO film on nitrided sapphire was obtained by introducing an MgO buffer layer before the ZnO growth. The effect of MgO layer was systematically studied by transmission electron microscopy investigations. It was found that the island feature of MgO buffer promoted the strain relaxation of the nitrided layer, which, in turn, improved the quality of the ZnO film. (c) 2007 Elsevier B.V. All rights reserved.

关键词:

characterization defects interfaces molecular beam epitaxy semiconducting II-VI materials

作者机构:

  • [ 1 ] Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China
  • [ 2 ] Univ Queensland, Sch Engn, St Lucia, Qld 4072, Australia
  • [ 3 ] Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 4 ] Tsing Hua Univ, Dept Phys, Beijing 100084, Peoples R China
  • [ 5 ] Beijing Univ Technol, Beijing, Peoples R China

通讯作者信息:

  • [Zou, J.]Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China

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来源 :

JOURNAL OF CRYSTAL GROWTH

ISSN: 0022-0248

年份: 2007

期: 1

卷: 305

页码: 74-77

1 . 8 0 0

JCR@2022

ESI学科: CHEMISTRY;

JCR分区:2

被引次数:

WoS核心集被引频次: 8

SCOPUS被引频次: 8

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

近30日浏览量: 2

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