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Author:

Ji, Yu-Hang (Ji, Yu-Hang.) | Huang, An-Ping (Huang, An-Ping.) | Yang, Meng-Qi (Yang, Meng-Qi.) | Gao, Qin (Gao, Qin.) | Yang, Xiu-Li (Yang, Xiu-Li.) | Chen, Xue-Liang (Chen, Xue-Liang.) | Wang, Mei (Wang, Mei.) | Xiao, Zhi-Song (Xiao, Zhi-Song.) | Wang, Ru-Zhi (Wang, Ru-Zhi.) (Scholars:王如志) | Chu, Paul K. (Chu, Paul K..)

Indexed by:

EI Scopus SCIE

Abstract:

1D memristors with nonvolatile memristive characteristics have large potential in brain-like neuromorphic computation and digital logic circuits. Herein, a novel memristive device based on wrinkled MoS(2)wrapped GaN nanowires (NWs) with a spray-coated Ag NWs network top electrode is described. The memristive device shows good stability/durability and retention characteristics for 798 cycles and 3.4 x 10(3)s, respectively, together with low switching voltages. A memristive model based on filament formation/rupture in the wrinkled surface of the NWs is proposed by analyzing the conductive characteristics and surface structure. Bipolar resistive switching is governed by the electric field associated with the wrinkled structure giving rise to migration of oxygen ions along the wrinkled surface of the NWs. The results enrich the knowledge pertaining to the design and optimization of memristors composed of NWs and also provide insights into the memristive behavior of memristors composed of 1D materials.

Keyword:

GaN nanowires memristive behavior MoS2 memristors

Author Community:

  • [ 1 ] [Ji, Yu-Hang]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 2 ] [Huang, An-Ping]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 3 ] [Gao, Qin]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 4 ] [Yang, Xiu-Li]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 5 ] [Chen, Xue-Liang]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 6 ] [Wang, Mei]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 7 ] [Xiao, Zhi-Song]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 8 ] [Yang, Meng-Qi]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China
  • [ 9 ] [Wang, Ru-Zhi]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China
  • [ 10 ] [Chu, Paul K.]City Univ Hong Kong, Dept Phys, Dept Mat Sci & Engn, Dept Biomed Engn,Kowloon, Tat Chee Ave, Hong Kong, Peoples R China

Reprint Author's Address:

  • 王如志

    [Huang, An-Ping]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China;;[Wang, Ru-Zhi]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China

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Source :

ADVANCED ELECTRONIC MATERIALS

ISSN: 2199-160X

Year: 2020

Issue: 10

Volume: 6

6 . 2 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:169

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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