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作者:

Ji, Yu-Hang (Ji, Yu-Hang.) | Huang, An-Ping (Huang, An-Ping.) | Yang, Meng-Qi (Yang, Meng-Qi.) | Gao, Qin (Gao, Qin.) | Yang, Xiu-Li (Yang, Xiu-Li.) | Chen, Xue-Liang (Chen, Xue-Liang.) | Wang, Mei (Wang, Mei.) | Xiao, Zhi-Song (Xiao, Zhi-Song.) | Wang, Ru-Zhi (Wang, Ru-Zhi.) (学者:王如志) | Chu, Paul K. (Chu, Paul K..)

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EI Scopus SCIE

摘要:

1D memristors with nonvolatile memristive characteristics have large potential in brain-like neuromorphic computation and digital logic circuits. Herein, a novel memristive device based on wrinkled MoS(2)wrapped GaN nanowires (NWs) with a spray-coated Ag NWs network top electrode is described. The memristive device shows good stability/durability and retention characteristics for 798 cycles and 3.4 x 10(3)s, respectively, together with low switching voltages. A memristive model based on filament formation/rupture in the wrinkled surface of the NWs is proposed by analyzing the conductive characteristics and surface structure. Bipolar resistive switching is governed by the electric field associated with the wrinkled structure giving rise to migration of oxygen ions along the wrinkled surface of the NWs. The results enrich the knowledge pertaining to the design and optimization of memristors composed of NWs and also provide insights into the memristive behavior of memristors composed of 1D materials.

关键词:

GaN nanowires memristive behavior MoS2 memristors

作者机构:

  • [ 1 ] [Ji, Yu-Hang]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 2 ] [Huang, An-Ping]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 3 ] [Gao, Qin]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 4 ] [Yang, Xiu-Li]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 5 ] [Chen, Xue-Liang]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 6 ] [Wang, Mei]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 7 ] [Xiao, Zhi-Song]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China
  • [ 8 ] [Yang, Meng-Qi]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China
  • [ 9 ] [Wang, Ru-Zhi]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China
  • [ 10 ] [Chu, Paul K.]City Univ Hong Kong, Dept Phys, Dept Mat Sci & Engn, Dept Biomed Engn,Kowloon, Tat Chee Ave, Hong Kong, Peoples R China

通讯作者信息:

  • 王如志

    [Huang, An-Ping]Beihang Univ, Sch Phys, Key Lab Micronano Measurement Manipulat & Phys, Minist Educ, Beijing 100191, Peoples R China;;[Wang, Ru-Zhi]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China

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来源 :

ADVANCED ELECTRONIC MATERIALS

ISSN: 2199-160X

年份: 2020

期: 10

卷: 6

6 . 2 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

ESI高被引阀值:169

被引次数:

WoS核心集被引频次: 5

SCOPUS被引频次: 4

ESI高被引论文在榜: 0 展开所有

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