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作者:

Yu, HP (Yu, HP.) | Sui, YK (Sui, YK.) | Wang, J (Wang, J.) | Zhang, FQ (Zhang, FQ.) | Dai, XL (Dai, XL.)

收录:

SCIE

摘要:

Concepts and techniques of response surface methodology have been widely applied in many branches of engineering, especially in the chemical and manufacturing areas. This paper presents an application of the methodology in a magnetic crystal Czochralski growth system for single crystal silicon to optimize the oxygen concentration at the crystal growth interface in a cusp magnetic field. The simulation demonstrates that the response surface methodology is a feasible algorithm for the optimization of the Czochralski crystal growth process.

关键词:

Czochralski magnetic field optimization response surface methodology

作者机构:

  • [ 1 ] Beijing Univ Technol, Numer Simulat Ctr Engn, Beijing 100022, Peoples R China
  • [ 2 ] Gen Res Inst NonFerrous Met, Beijing 100088, Peoples R China

通讯作者信息:

  • [Yu, HP]Beijing Univ Technol, Numer Simulat Ctr Engn, Beijing 100022, Peoples R China

电子邮件地址:

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来源 :

JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY

ISSN: 1005-0302

年份: 2006

期: 2

卷: 22

页码: 173-178

1 0 . 9 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

JCR分区:3

被引次数:

WoS核心集被引频次: 5

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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