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作者:

Mao, SC (Mao, SC.) (学者:毛圣成) | Han, XD (Han, XD.) (学者:韩晓东) | Luo, JF (Luo, JF.) | Zhang, Z (Zhang, Z.)

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EI Scopus SCIE

摘要:

Electron backscattering diffraction (EBSD) investigations were carried out on three ultra-thin TiNi rolling sheet samples with thickness of 0.15, 0.2 and 0.3 mm, respectively. The microstructure and texture evolution were investigated as a function of the sheet thickness. The automated EBSD system allows integrating the grain boundary, grain size and the preferred orientation information to be revealed simultaneously. By ODF analysis, the preferred orientations are revealed as {111} <0<(1)over bar>1>, {223} <0<(2)over bar>1>, and {332} <1<(1)over bar>0> in the three TiNi sheets. The {111} <0<(1)over bar>1> component evolves stronger with reducing the thickness of the rolling sheet. (C) 2005 Elsevier B.V. All rights reserved.

关键词:

EBSD grain boundary preferred orientation TiNi

作者机构:

  • [ 1 ] Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100022, Peoples R China
  • [ 2 ] Beijing Univ Technol, Coll Appl Math & Phys, Beijing 100022, Peoples R China

通讯作者信息:

  • 韩晓东

    [Han, XD]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100022, Peoples R China

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来源 :

MATERIALS LETTERS

ISSN: 0167-577X

年份: 2005

期: 28

卷: 59

页码: 3567-3571

3 . 0 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

JCR分区:2

被引次数:

WoS核心集被引频次: 15

SCOPUS被引频次: 14

ESI高被引论文在榜: 0 展开所有

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