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作者:

Shu, XW (Shu, XW.) | Xu, C (Xu, C.) (学者:徐晨) | Tian, ZX (Tian, ZX.) | Shen, GD (Shen, GD.)

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EI Scopus SCIE

摘要:

The paper reports for the first time a simple, economical and available way for passivating air cleaved facets of high power semiconductor lasers with Al-contained active region using a electron-beam evaporated ZnSe thin layer, which was demonstrated to be an effective way for improving the reliability of high power lasers. (C) 2005 Elsevier Ltd. All rights reserved.

关键词:

electron-beam evaporation reliability facet passivation

作者机构:

  • [ 1 ] Beijing Univ Technol, Beijing Optoelect Technol Lab, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

通讯作者信息:

  • [Shu, XW]Beijing Univ Technol, Beijing Optoelect Technol Lab, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

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来源 :

SOLID-STATE ELECTRONICS

ISSN: 0038-1101

年份: 2005

期: 12

卷: 49

页码: 2016-2017

1 . 7 0 0

JCR@2022

ESI学科: PHYSICS;

JCR分区:2

被引次数:

WoS核心集被引频次: 8

SCOPUS被引频次: 8

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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