Oxygen　environment　was　applied　to　the　scanning　electron　microscopy　(SEM)　analysis　of　insulating　samples.　In　the　high　vacuum　SEM,　a　local　oxygen　pressure　was　provided,　and　in　the　environmental　SEM,　oxygen　atmosphere　was　used　instead　of　water,　the　commercial　mode.　The　charging　effects　in　the　SEM　observation　and　component　characterization　of　samples　such　as　Al2O3,　Al(OH)(3),　Mg(OH)(2)　and　others　can　be　eliminated　or　significantly　reduced.　The　oxygen　environment　does　not　only　provide　a　new　approach　to　releasing　the　charging　difficulty　in　the　analyses　using　electron　beam　as　a　probe,　but　also　provide　an　insightful　hint　to　the　understanding　of　the　charging　processes　in　general.　(c)　2004　Elsevier　B.V.　All　rights　reserved.