Translated Title
Optical Properties of C60 Thin Films Deposited on Fluorophlogopite Substrates
Translated Abstract
High quality C60 thin films are deposited on fluorophlogopite substrates by hot-wall epitaxy method.The surface crystal morphology of C60 thin films is observed under an atomic force microscopy.The UV-Vis absorption spectra of C60 thin films with different film thickness are analyzed, and the absorption coefficient α is calculated from the measured transmittance and the reflection spectra.Based on the interband transition theory of semiconductor, the values of hu→t1u (dipole-forbidden) and hu→t1g (dipole-allowed) optical band gaps are obtained from the analysis of the corresponding absorption coefficient α.
Access Number
WF:perioarticalbdtxb200103011
Corresponding authors email
