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Author:

Chen, GH (Chen, GH.) | Zhu, XH (Zhu, XH.) | Yin, SY (Yin, SY.) | Hu, YH (Hu, YH.) | Zhang, WL (Zhang, WL.)

Indexed by:

EI Scopus SCIE

Abstract:

in order to obtain a compact-structure, saving-energy and good-property system based on the conventional microwave electron-cyclotron resonance chemical vapor deposition (MWECR-CVD) system, we proposed a new technique using a magnetic field combination of an electromagnetic coil and a permanent magnet unit, as well as adopting a dedicated microwave coupling structure. The experiment results showed that by using this new optimized system the deposition rate can reach more than 2.5 nm/s, and the photosensitivity of a-Si:H films can be up to 1.1 x 10(5). (c) 2004 Elsevier Ltd. All rights reserved.

Keyword:

photosensitivity microwave electron-cyclotron resonance chemical vapor deposition (MWECR-CVD) magnetic field combination deposition rate microwave coupling structure

Author Community:

  • [ 1 ] Beijing Univ Technol, Dept Mat Sci & Engn, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Zhu, XH]Beijing Univ Technol, Dept Mat Sci & Engn, Beijing 100022, Peoples R China

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Source :

VACUUM

ISSN: 0042-207X

Year: 2005

Issue: 3

Volume: 77

Page: 355-358

4 . 0 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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