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作者:

Li, Zezheng (Li, Zezheng.) | Zhou, Bin (Zhou, Bin.) | Chen, Si (Chen, Si.) | An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) (学者:秦飞)

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CPCI-S EI

摘要:

This paper uses the finite element method to establish a three-dimensional finite element model of a ceramic column grid array (CCGA) package flat cover and T-cover structure. The stress distribution of CCGA package sealing cover under three random vibration loads (acceleration root mean square values of 53.5 m/s(2), 92.6 m/s(2), 119.5 m/s(2)) is analyzed, and the flat cover and T-shaped cover are respectively determined. The dangerous position of the plate structure, the initial position of the crack and the crack propagation. The results show that the flat cover plate is prone to cracks at the four corners of the interface between sealing cover and solder, and the T-shaped cover plate is liable to cracks in the middle of the edge of the interface between sealing cover and solder.

关键词:

random vibration reliability analysis finite element method CCGA package

作者机构:

  • [ 1 ] [Li, Zezheng]Beijing Univ Technol, Beijing, Peoples R China
  • [ 2 ] [An, Tong]Beijing Univ Technol, Beijing, Peoples R China
  • [ 3 ] [Qin, Fei]Beijing Univ Technol, Beijing, Peoples R China
  • [ 4 ] [Li, Zezheng]Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou, Peoples R China
  • [ 5 ] [Zhou, Bin]Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou, Peoples R China
  • [ 6 ] [Chen, Si]Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou, Peoples R China

通讯作者信息:

  • 秦飞

    [An, Tong]Beijing Univ Technol, Beijing, Peoples R China;;[Qin, Fei]Beijing Univ Technol, Beijing, Peoples R China

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来源 :

ICEPT2019: THE 2019 20TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY

年份: 2019

语种: 英文

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