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作者:

Song, Xubo (Song, Xubo.) | Lv, Yuanjie (Lv, Yuanjie.) | Zhang, Yamin (Zhang, Yamin.) | Zhang, Lisen (Zhang, Lisen.) | Liang, Shixiong (Liang, Shixiong.) | Tan, Xin (Tan, Xin.) | Dun, Shaobo (Dun, Shaobo.) | Yang, Dabao (Yang, Dabao.) | Zhang, Zhirong (Zhang, Zhirong.) | Wang, Yuangang (Wang, Yuangang.) | Feng, Zhihong (Feng, Zhihong.)

收录:

CPCI-S

摘要:

We presented a GaN Schottky diode model with consideration of self-heating effect of devices in operation. The impact of diode chip temperature on the current and capacitance was taken into account in this model. The thermal resistance of diode chip was extracted by simulation combined measurement to calculate the temperature of Schottky junction with different pumping power. Advantages of established device model in the design of a 220GHz frequency doubler were presented in the end.

关键词:

GaN Schottky diodes model Self-heating THz

作者机构:

  • [ 1 ] [Song, Xubo]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 2 ] [Lv, Yuanjie]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 3 ] [Zhang, Lisen]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 4 ] [Liang, Shixiong]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 5 ] [Tan, Xin]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 6 ] [Dun, Shaobo]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 7 ] [Yang, Dabao]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 8 ] [Zhang, Zhirong]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 9 ] [Wang, Yuangang]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 10 ] [Feng, Zhihong]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China
  • [ 11 ] [Zhang, Yamin]Beijing Univ Technol, Lab Semicond Device Reliabil Phys, Beijing, Peoples R China

通讯作者信息:

  • [Liang, Shixiong]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China;;[Feng, Zhihong]Ebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Hebei, Peoples R China

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来源 :

2019 IEEE 13TH INTERNATIONAL CONFERENCE ON ASIC (ASICON)

ISSN: 2162-7541

年份: 2019

语种: 英文

被引次数:

WoS核心集被引频次: 0

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