Ptychography　is　a　widely　used　lensless　coherent　diffraction　imaging　approach,　in　which　the　complex　transmittance　function　of　the　object　is　retrieved　from　a　set　of　diffraction　patterns　originating　from　overlapping　sample　illumination　area.　In　this　paper,　we　propose　a　normal-incidence　reflection　ptychographic　system.　The　sample　and　detector　are　located　on　each　side　of　the　beam　splitter　similarly　to　Michelson　interferometer　without　reference　beam.　This　system　can　reveal　the　topographic　structure　of　reflective　samples.　Compared　with　Michelson　interferometer　based　off-axis　digital　holography,　the　field-of-view　of　the　proposed　reflective　ptychography　is　unlimited　by　the　aperture　of　the　detector.