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作者:

Yang Mengke (Yang Mengke.) | Qin Fei (Qin Fei.) (学者:秦飞) | Yu Daquan (Yu Daquan.)

收录:

CPCI-S

摘要:

As the increasing of the chip integration and adoption of large-size wafers, the warpage problem is more serious in WLCSP. Considering that the die size becomes smaller, a full finite-element model with small die-size is difficult to develop. In this paper, a quarter model and a half general plane deformation (GPD) slice model were developed through finite element method (FEM). Their warpage and stress results were compared. Influences of different material and structural parameters in molding process were investigated finally.

关键词:

Half-GPD model FEM Molding process WLCSP warpage

作者机构:

  • [ 1 ] [Yang Mengke]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 2 ] [Qin Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 3 ] [Yu Daquan]Huatian Technol Kunshan Elect, Kunshan, Peoples R China

通讯作者信息:

  • 秦飞

    [Qin Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China

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来源 :

2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)

年份: 2018

页码: 886-890

语种: 英文

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