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作者:

Li, Peng (Li, Peng.) | Han, Jing (Han, Jing.) | Wang, Yan (Wang, Yan.) | Guo, Fu (Guo, Fu.) (学者:郭福) | Ma, Limin (Ma, Limin.) | Wang, Yishu (Wang, Yishu.)

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CPCI-S

摘要:

The requirements for lead-free electronics lead to the development of new Pb-free solders. The Sn-3.0Ag-0.5Cu (SAC305) is one of them and is widely used in the lead-free solder market. But the melting point of it, 217 degrees C, exceeds that of traditional Sn-37Pb solder. The lower melting temperature of lead-free solder are needed to meet the requirements of the manufacturing process that depend on conventional Sn-Pb based reflow equipment. Adding Bi can reducing the melting point, but it will affect the mechanical properties. Adding In can also reduce the melting point without reducing the mechanical strength of the joints. But In is rare and expensive. Therefore, there are Sn-Ag-Bi-In solders, four alloy solder systems, by adding the two kinds of elements into Sn-Ag based solder. Sn-3Ag-3Bi-3In (SABI333) is an alternative four alloy Pb-lead solder, with a melting temperature, 198 degrees C, close to that of eutectic Sn-Pb solder. This study elucidates the microstructure and intermetallic compounds (IMCs) formed at the interfaces and in the bulk solder in SABI333 solder joints on Cu matrix. In the reactions between Sn-Bi-In solders and Cu matrix, the compounds formed at the interfaces were CU6 (Sn, In)(5). Whereas, in SABI333 solder joint, the compounds formed at the interfaces were CU6Sn5 and CU3Sn, without the substitution of Sn by In. The compound formed in the bulk solder was identified as CU6Sn5, which is totally different from the SAC305 and Sn-Bi-In solders. The quantitative test of exact compound composition of IMC formed at the interface and in the bulk solder joints was determined by electron microprobe analysis (EPMA).

关键词:

EPMA IMC Low temperature Pb-free solder Microstructure Sn-Ag-Bi-In

作者机构:

  • [ 1 ] [Li, Peng]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 2 ] [Han, Jing]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Yan]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 4 ] [Guo, Fu]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 5 ] [Ma, Limin]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 6 ] [Wang, Yishu]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100124, Peoples R China

通讯作者信息:

  • 郭福

    [Guo, Fu]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100124, Peoples R China

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来源 :

2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)

年份: 2017

页码: 655-659

语种: 英文

被引次数:

WoS核心集被引频次: 3

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ESI高被引论文在榜: 0 展开所有

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