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作者:

Wang, Guangyao (Wang, Guangyao.) | Deng, Wenjie (Deng, Wenjie.) | Chen, Xiaoqing (Chen, Xiaoqing.) | Wang, Peng (Wang, Peng.) | Xiao, Yu (Xiao, Yu.) | Li, Jingfeng (Li, Jingfeng.) | Chu, Feihong (Chu, Feihong.) | Liu, Beiyun (Liu, Beiyun.) | Chen, Yongfeng (Chen, Yongfeng.) | Lu, Yue (Lu, Yue.) (学者:卢岳) | Sui, Manling (Sui, Manling.) (学者:隋曼龄) | Liu, Zhihong (Liu, Zhihong.) | Diao, Xungang (Diao, Xungang.) | Yan, Hui (Yan, Hui.) | Zhang, Yongzhe (Zhang, Yongzhe.) (学者:张永哲)

收录:

EI SCIE

摘要:

Transition metal dichalcogenides (TMDCs) are promising for future electronic and optoelectronic applications, such as field effect transistors (FETs), for their high carrier mobility with a thin layer, wide bandgap, and organic-like flexibility. However, background doping and unipolar electrical characteristics are commonly observed in TMDCs and their based FETs due to the naturally inevitable vacancy defects, which limit their application in electronics and optoelectronics systems. Here, taking MoS2 as an example, in a TMDC FET, ambipolar properties were achieved at room temperature by introducing an amorphous solid ionic conductor lithium tantalate (LiTaO3) as the gate dielectric, which could guarantee the modulation of the Fermi level in the MoS2 channel by the gate electric field. Based on the modulation mechanisms by the solid ionic conductor-gated electric field for the transformation of conduction mode, the three-terminal device exhibits a gate-controlled rectifying, that is, thyristor performance with a high rectification ratio over 300 obtained at a low gate voltage of 2V. The present results show the great potential of TMDCs in future logic and other electronic device applications.

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作者机构:

  • [ 1 ] [Wang, Guangyao]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Deng, Wenjie]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Chen, Xiaoqing]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Peng]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Li, Jingfeng]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 6 ] [Chu, Feihong]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 7 ] [Liu, Beiyun]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 8 ] [Chen, Yongfeng]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 9 ] [Lu, Yue]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 10 ] [Sui, Manling]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 11 ] [Yan, Hui]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 12 ] [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 13 ] [Wang, Guangyao]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 14 ] [Deng, Wenjie]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 15 ] [Chen, Xiaoqing]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 16 ] [Wang, Peng]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 17 ] [Li, Jingfeng]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 18 ] [Chu, Feihong]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 19 ] [Liu, Beiyun]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 20 ] [Chen, Yongfeng]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 21 ] [Yan, Hui]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 22 ] [Zhang, Yongzhe]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 23 ] [Xiao, Yu]Beihang Univ, Dept Phys, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
  • [ 24 ] [Diao, Xungang]Beihang Univ, Dept Phys, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
  • [ 25 ] [Lu, Yue]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, 100 Pingleyuan, Beijing 100124, Peoples R China
  • [ 26 ] [Sui, Manling]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, 100 Pingleyuan, Beijing 100124, Peoples R China
  • [ 27 ] [Liu, Zhihong]Xidian Univ, Sch Microelect, Xian 710071, Peoples R China

通讯作者信息:

  • 张永哲

    [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China;;[Zhang, Yongzhe]Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China

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来源 :

APPLIED PHYSICS LETTERS

ISSN: 0003-6951

年份: 2020

期: 5

卷: 117

4 . 0 0 0

JCR@2022

ESI学科: PHYSICS;

ESI高被引阀值:26

JCR分区:2

被引次数:

WoS核心集被引频次: 2

SCOPUS被引频次: 2

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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