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作者:

Chi, Weining (Chi, Weining.) | Wang, Dayong (Wang, Dayong.) (学者:王大勇) | Wang, Yunxin (Wang, Yunxin.) (学者:王云新) | Zhao, Jie (Zhao, Jie.) | Rong, Lu (Rong, Lu.) (学者:戎路) | Yuan, Yuanyuan (Yuan, Yuanyuan.)

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CPCI-S EI Scopus

摘要:

Optical Diffraction Tomography (ODT), as a novel 3D imaging technique, can obtain a 3D refractive index (RI) distribution to reveal the important optical properties of transparent samples. According to the theory of ODT, an optical diffraction tomography setup is built based on the Mach-Zehnder interferometer. The propagation direction of object beam is controlled by a 2D translation stage, and 121 holograms based on different illumination angles are recorded by a Charge-coupled Device (CCD). In order to prove the validity and accuracy of the ODT, the 3D RI profile of microsphere with a known RI is firstly measured. An iterative constraint algorithm is employed to improve the imaging accuracy effectively. The 3D morphology and average RI of the microsphere are consistent with that of the actual situation, and the RI error is less than 0.0033. Then, an optical element fabricated by laser with a non-uniform RI is taken as the sample. Its 3D RI profile is obtained by the optical diffraction tomography system.

关键词:

3D imaging Ewald sphere Optical diffraction tomography refractive index

作者机构:

  • [ 1 ] [Chi, Weining]Beijing Univ Technol, Coll Appl Sci, 100 Pingleyuan Rd, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Dayong]Beijing Univ Technol, Coll Appl Sci, 100 Pingleyuan Rd, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Yunxin]Beijing Univ Technol, Coll Appl Sci, 100 Pingleyuan Rd, Beijing 100124, Peoples R China
  • [ 4 ] [Zhao, Jie]Beijing Univ Technol, Coll Appl Sci, 100 Pingleyuan Rd, Beijing 100124, Peoples R China
  • [ 5 ] [Rong, Lu]Beijing Univ Technol, Coll Appl Sci, 100 Pingleyuan Rd, Beijing 100124, Peoples R China
  • [ 6 ] [Yuan, Yuanyuan]Beijing Univ Technol, Coll Appl Sci, 100 Pingleyuan Rd, Beijing 100124, Peoples R China
  • [ 7 ] [Wang, Dayong]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 8 ] [Wang, Yunxin]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 9 ] [Zhao, Jie]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 10 ] [Rong, Lu]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China

通讯作者信息:

  • 王大勇

    [Wang, Dayong]Beijing Univ Technol, Coll Appl Sci, 100 Pingleyuan Rd, Beijing 100124, Peoples R China;;[Wang, Dayong]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China

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来源 :

SPECTROSCOPY AND SIGNAL PROCESSING TECHNOLOGY

ISSN: 0277-786X

年份: 2017

卷: 10620

语种: 英文

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