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作者:

Fu, Jingyan (Fu, Jingyan.) | Pourbakhsh, Seyed Alireza (Pourbakhsh, Seyed Alireza.) | Chen, Xiaowei (Chen, Xiaowei.) | Li, Mingli (Li, Mingli.) | Lin, Zhibin (Lin, Zhibin.) | Hou, Ligang (Hou, Ligang.) | Haring, Frederik (Haring, Frederik.) | Gong, Na (Gong, Na.) | Wang, Jinhui (Wang, Jinhui.)

收录:

CPCI-S

摘要:

Phase change materials (PCMs), as a thermal storage unit, have been used in thermal management area for integrated circuits (ICs). However, the heat dissipation from the chip to PCM-based heat sink needs much long time which greatly suppresses cooling effect of PCMs. In this paper, a new package frame with PCM directly touching top of the chips inside the package cavity instead of using PCM-based heat sink is proposed to accelerate this heat dissipation process. The proposed model is verified by carrying out simulations and experiments. To obtain more precise experimental results, the extra tiny thermocouple and chip-level heat generators are utilized. The results show 2 degrees C-5 degrees C temperature reductions under 300 mW-800 mW input which proves the effectiveness of the proposed approach. What's more, this method can be easily combined with other thermal management methods to further alleviate the thermal problem of the chips.

关键词:

phase change material thermal simulation experimental verification thermal constraint method

作者机构:

  • [ 1 ] [Fu, Jingyan]North Dakota State Univ, Dept Elect & Comp Engn, Fargo, ND 58102 USA
  • [ 2 ] [Pourbakhsh, Seyed Alireza]North Dakota State Univ, Dept Elect & Comp Engn, Fargo, ND 58102 USA
  • [ 3 ] [Chen, Xiaowei]North Dakota State Univ, Dept Elect & Comp Engn, Fargo, ND 58102 USA
  • [ 4 ] [Gong, Na]North Dakota State Univ, Dept Elect & Comp Engn, Fargo, ND 58102 USA
  • [ 5 ] [Wang, Jinhui]North Dakota State Univ, Dept Elect & Comp Engn, Fargo, ND 58102 USA
  • [ 6 ] [Fu, Jingyan]Beijing Univ Technol, VLSI, Beijing 100124, Peoples R China
  • [ 7 ] [Hou, Ligang]Beijing Univ Technol, VLSI, Beijing 100124, Peoples R China
  • [ 8 ] [Fu, Jingyan]Beijing Univ Technol, Syst Lab, Beijing 100124, Peoples R China
  • [ 9 ] [Hou, Ligang]Beijing Univ Technol, Syst Lab, Beijing 100124, Peoples R China
  • [ 10 ] [Li, Mingli]North Dakota State Univ, Dept Civil & Environm Engn, Fargo, ND 58102 USA
  • [ 11 ] [Lin, Zhibin]North Dakota State Univ, Dept Civil & Environm Engn, Fargo, ND 58102 USA
  • [ 12 ] [Haring, Frederik]North Dakota State Univ, NDSU Res Operat Grp, Fargo, ND 58102 USA

通讯作者信息:

  • [Wang, Jinhui]North Dakota State Univ, Dept Elect & Comp Engn, Fargo, ND 58102 USA

电子邮件地址:

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来源 :

2017 IEEE 60TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS)

ISSN: 1548-3746

年份: 2017

页码: 985-988

语种: 英文

被引次数:

WoS核心集被引频次: 1

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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