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作者:

Wang, Fengpeng (Wang, Fengpeng.) | Wang, Dayong (Wang, Dayong.) (学者:王大勇) | Rong, Lu (Rong, Lu.) (学者:戎路) | Wang, Yunxin (Wang, Yunxin.) (学者:王云新) | Zhao, Jie (Zhao, Jie.)

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摘要:

For traditional dual-plane on-axis digital holography, the robustness is lower because it is difficult to maintain the stability of the phase difference between the object beam and the reference beam, and it may be invalid when the objects are on the surface of a medium with uneven thickness. An improved dual-plane digital holographic method based on Mach-Zehnder interferometer is presented to address these problems. Two holograms are recorded at two different planes separated by a small distance. Then, the zero-order image and conjugated image are eliminated by Fourier domain processing. In order to enhance the robustness of the system, the object is illuminated by a stochastic beam that is a speckle wave produced by a diffuser. Simulated and experimental results are shown to demonstrate that the proposed method has greater robustness than the traditional dual-plane on-axis digital holography and it can be used to imaging on the irregular surface of a transparent medium.

关键词:

Stochastic illumination Digital holography Dual-plane Mach-Zehnder interferometer

作者机构:

  • [ 1 ] [Wang, Fengpeng]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Dayong]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Rong, Lu]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Yunxin]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 5 ] [Wang, Fengpeng]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 6 ] [Wang, Dayong]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 7 ] [Rong, Lu]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 8 ] [Wang, Yunxin]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 9 ] [Wang, Fengpeng]Gannan Normal Univ, Sch Phys & Elect Informat, Ganzhou 341000, Jiangxi, Peoples R China
  • [ 10 ] [Zhao, Jie]Beijing Univ Technol, Pilot Coll, 89 Luyuan South St, Beijing 101101, Peoples R China

通讯作者信息:

  • 王大勇

    [Wang, Dayong]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China;;[Wang, Dayong]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China

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来源 :

8TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY: OPTICAL TEST, MEASUREMENT TECHNOLOGY, AND EQUIPMENT

ISSN: 0277-786X

年份: 2016

卷: 9684

语种: 英文

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