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作者:

Feng, RuiRui (Feng, RuiRui.) | Xie, XueSong (Xie, XueSong.) | Meng, Ju (Meng, Ju.) | Tian, Ce (Tian, Ce.) | Zhang, YiNan (Zhang, YiNan.)

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CPCI-S

摘要:

SiC rectifier diodes are important components in the power electronics industry because they have advantages over conventional silicon diodes, including large currents, high operation temperatures, and other similar properties. In the devices' current voltage characteristics, it is readily observable that the curves at different temperatures have a common cross-over point. We found that the temperature dependence of the ohmic contact resistance may explain this behavior. To verify this, we constructed a simple model, which demonstrated that this phenomenon is caused by the proportional relationship between resistance and temperature.

关键词:

Ohmic contact resistance I-V-T characteristics power SiC diode

作者机构:

  • [ 1 ] [Feng, RuiRui]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 2 ] [Xie, XueSong]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 3 ] [Meng, Ju]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 4 ] [Tian, Ce]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, YiNan]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China

通讯作者信息:

  • [Xie, XueSong]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China

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来源 :

2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)

年份: 2016

页码: 1239-1241

语种: 英文

被引次数:

WoS核心集被引频次: 1

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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