• 综合
  • 标题
  • 关键词
  • 摘要
  • 学者
  • 期刊-刊名
  • 期刊-ISSN
  • 会议名称
搜索

作者:

Lin, Jian (Lin, Jian.) | Gao, Peng (Gao, Peng.) | Lei, Yongping (Lei, Yongping.) (学者:雷永平) | Wang, Lan (Wang, Lan.)

收录:

CPCI-S

摘要:

In SMT, it is not easy to study the failure process of solder joint under thermal-mechanical coupled fatigue loading. However, it is very important for the electrical circuit working in the thermal and vibration coupled environment. In this paper, the inelastic strain evolution in lead-free solder joint under thermal, mechanical, thermal-mechanical coupled fatigue loading was studied by numerical simulation, respectively. And the effect of amplitude and frequency of mechanical fatigue loading on inelastic strain in solder joint were investigated. It was shown that under thermal-mechanical coupled fatigue loading, there is a large value distribution of inelastic strain near the corner of the border between the chip and solder material. When the amplitude and frequency of mechanical fatigue loading are both small, the creep strain in solder joint is dominant. Otherwise, the plastic strain is larger than creep strain.

关键词:

Inelastic strain Numerical model SMT Solder joint Thermal-mechanical coupled fatigue

作者机构:

  • [ 1 ] [Lin, Jian]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 2 ] [Gao, Peng]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 3 ] [Lei, Yongping]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 4 ] [Wang, Lan]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China

通讯作者信息:

  • [Lin, Jian]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China

电子邮件地址:

查看成果更多字段

相关关键词:

相关文章:

来源 :

2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)

年份: 2013

页码: 937-940

语种: 英文

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

近30日浏览量: 2

在线人数/总访问数:1078/2911495
地址:北京工业大学图书馆(北京市朝阳区平乐园100号 邮编:100124) 联系我们:010-67392185
版权所有:北京工业大学图书馆 站点建设与维护:北京爱琴海乐之技术有限公司