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作者:

Wang Yunxin (Wang Yunxin.) (学者:王云新) | Wang Dayong (Wang Dayong.) (学者:王大勇) | Yang, Dengcai (Yang, Dengcai.) | Ouyang Liting (Ouyang Liting.) | Jie, Zhao (Jie, Zhao.) | Panezai, Spozmai (Panezai, Spozmai.)

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CPCI-S EI Scopus

摘要:

The quality of the microfluidic chip will influence the separations, injections, reactions and measurements of samples in the microfluidic system, it is essential to detect the structure such as the width, depth and roughness for evaluating its performance. Aiming at this requirement, digital holography microscope method is developed to achieve the quantitative, non-contact phase imaging with the full field. Firstly, the digital image plane holographic microscopy is designed, and the complex amplitude of the whole wave field is reconstructed by the angular spectrum method. The two-step phase subtraction and surface fitting methods are combined to eliminate the phase aberration, and the unwrapped phase information is extracted using the least-squares phase-unwrapping algorithm. Meanwhile, we acquire the profile parameters of the microchannel using white light interferometer, and the results demonstrate that the digital image plane holographic microscopy is feasible and effective for the profile measurement of microchannels in the microfluidic chip.

关键词:

digital holography image plane holography microfluidic chip phase imaging

作者机构:

  • [ 1 ] [Wang Yunxin]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Wang Dayong]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Yang, Dengcai]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Ouyang Liting]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 5 ] [Panezai, Spozmai]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 6 ] [Wang Yunxin]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Wang Dayong]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Yang, Dengcai]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 9 ] [Ouyang Liting]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 10 ] [Panezai, Spozmai]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 11 ] [Jie, Zhao]Pilot Coll Beijing Univ Technol, Beijing 101101, Peoples R China

通讯作者信息:

  • 王云新

    [Wang Yunxin]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China

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来源 :

6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: DESIGN, MANUFACTURING, AND TESTING OF SMART STRUCTURES, MICRO- AND NANO- OPTICAL DEVICES, AND SYSTEMS

ISSN: 0277-786X

年份: 2012

卷: 8418

语种: 英文

被引次数:

WoS核心集被引频次: 1

SCOPUS被引频次: 2

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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