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作者:

Wang, Kaixuan (Wang, Kaixuan.) | Yu, Xuyang (Yu, Xuyang.) | Li, Pingxue (Li, Pingxue.) (学者:李平雪) | Wang, Tingting (Wang, Tingting.) | Zhang, Yuefei (Zhang, Yuefei.) (学者:张跃飞) | Li, Chunyong (Li, Chunyong.)

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摘要:

Study of the damage characteristics of silicon-based photodetectors is of great significance in improving application performance, but few studies of laser-induced damage have been undertaken on photodetectors irradiated by hundred-ps fiber lasers. In this work, we demonstrate an all-fiber ps-pulsed laser system which outputs a pulse width of 226.5 ps and an average power of 20 W at 2.4 MHz repetition rate, with high beam quality and pulse stability. Experiments use this fiber amplifier to irradiate a silicon-based positive-intrinsic-negative (PIN) photodiode. The changes in detector performance and surface morphology are confirmed by systematic experiments on the laser-irradiated detector. The results show that detection performance was sensitive to laser energy, and the failure damage threshold was about 864 kW cm(-2). Based on hydrodynamics theory, we simulated the laser-induced plasma density distribution in a PIN photodiode and studied the thermal and plasma damage mechanisms in the PIN photodiode.

关键词:

silicon-based photodetector hundred-picosecond laser thermal and plasma damage threshold

作者机构:

  • [ 1 ] [Wang, Kaixuan]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Yu, Xuyang]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Li, Pingxue]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Tingting]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, Yuefei]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Li, Chunyong]Univ Durham, Dept Phys, South Rd, Durham DH1 3LE, England

通讯作者信息:

  • 李平雪

    [Li, Pingxue]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

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来源 :

LASER PHYSICS

ISSN: 1054-660X

年份: 2020

期: 7

卷: 30

1 . 2 0 0

JCR@2022

ESI学科: PHYSICS;

ESI高被引阀值:100

被引次数:

WoS核心集被引频次: 6

SCOPUS被引频次: 6

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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