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作者:

Ban Zhaowei (Ban Zhaowei.) | Qin Fei (Qin Fei.) (学者:秦飞) | An Tong (An Tong.) | Xia Guofeng (Xia Guofeng.) | Liu Chengyan (Liu Chengyan.)

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CPCI-S

摘要:

Infrared thermography has become increasingly important for non-destructive testing to detect internal defections, involving delaminations, cracks and voids. In this paper, the principle of infrared thermography is presented briefly. And a finite element approach is proposed to simulate the process of infrared thermography nondestructive testing about QFN packages. By changing with the length and the thickness of the delamination and the size of uniform surface heat flux, the surface thermal characteristics of a QFN are analyzed. The simulation results can provide basis and reference for the following work to detect defects in packages by infrared thermography method.

关键词:

delamination finite element method infrared thermography QFN Packages

作者机构:

  • [ 1 ] [Ban Zhaowei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Qin Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [An Tong]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Xia Guofeng]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Liu Chengyan]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

通讯作者信息:

  • [Ban Zhaowei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

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来源 :

2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP)

年份: 2011

页码: 519-522

语种: 英文

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