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Author:

Shen, Li (Shen, Li.) | Xu, Guangchen (Xu, Guangchen.) | Zhao, Ran (Zhao, Ran.) | Guo, Fu (Guo, Fu.) (Scholars:郭福)

Indexed by:

CPCI-S

Abstract:

The indium-based solders and bismuth-based solders are commonly employed in soldering the thermopile. Since the wettability between bismuth telluride materials and low melting point alloy solders is poor, a nickel layer was employed on the surface of thermoelectric materials. In this study, in the atmospheric environment, the eutectic Sn-Bi and Sn-In solders spreaded on the p-type thermoelectric respectively without using soldering flux, the corresponding interfacial microstructures were indentified. The interfacial reaction is more sufficient under 300 degrees C when comparing to that under 250 degrees C. In addition, a thin nickel layer was deposited on the thermoelectric unit by vapor deposition facility. However, a thin Ni-plated layer on thermoelectric materials might induce severe formation of cracks.

Keyword:

Author Community:

  • [ 1 ] [Shen, Li]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 2 ] [Xu, Guangchen]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 3 ] [Zhao, Ran]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 4 ] [Guo, Fu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China

Reprint Author's Address:

  • [Shen, Li]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China

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Source :

2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP)

Year: 2011

Page: 1172-,

Language: English

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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