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作者:

Xiao, Yixin (Xiao, Yixin.) | Zhang, Xin (Zhang, Xin.) | Li, Rongrong (Li, Rongrong.) | Liu, Hongliang (Liu, Hongliang.) | Hu, Yanlin (Hu, Yanlin.) | Zhang, Jiuxing (Zhang, Jiuxing.)

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EI Scopus SCIE

摘要:

Large-size and high-quality single-crystal GdB(6)conductive ceramics (length greater than 35 mm and diameter greater than 6 mm) were prepared by optical zone melting, and the single-crystal quality was characterized by single-crystal diffraction, Laue photo, crystal plane rocking curve, and single-crystal fracture scan. Electrochemical corrosion equipment of single-crystal GdB(6)conductive ceramic tips was newly designed, which greatly reduced the preparation time of tips from more than 10 h to 2.75 h. The field electron emission current density of the single-crystal GdB(6)conductive ceramic tip (r approximate to 500 nm) prepared by the device under applied voltage (2550 V) is 2.24 x 10(4)A/cm(2). This paper also theoretically calculates the electronic structure and electron work function of single-crystal GdB(6)under a strong electric field (0.1 V/angstrom). The trapping ability of the B-octahedron in the single crystal GdB(6)conductive ceramics against the free electrons of Gd is greatly weakened under a strong electric field (0.1 V/angstrom), and the free electrons also have a certain enrichment phenomenon on the surface of GdB6. The surface barrier of single-crystal GdB(6)conductive ceramic will be shortened and narrowed sharply due to the strong electric field (0.1 V/angstrom), which causes the work function of (100) crystal plane of single-crystal GdB(6)to decrease sharply (0.38 eV). This causes the free electrons in Gd to have greater energy at the time of emission, and it is easier to get rid of the trap of surface barriers, which is conducive to field electron emission.

关键词:

field electron emission single-crystal GdB(6)tip Optical zone melting first principle

作者机构:

  • [ 1 ] [Xiao, Yixin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang, Xin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 3 ] [Li, Rongrong]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 4 ] [Liu, Hongliang]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, Jiuxing]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 6 ] [Zhang, Jiuxing]Hefei Univ Technol, Sch Mat Sci & Engn, Hefei 230009, Peoples R China
  • [ 7 ] [Hu, Yanlin]Beijing Inst Control Engn, Beijing 100080, Peoples R China

通讯作者信息:

  • [Zhang, Xin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China

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来源 :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

年份: 2020

期: 9

卷: 49

页码: 5622-5630

2 . 1 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

ESI高被引阀值:169

被引次数:

WoS核心集被引频次: 8

SCOPUS被引频次: 8

ESI高被引论文在榜: 0 展开所有

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