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Author:

Zhu Wei-min (Zhu Wei-min.) | Wang Da-yong (Wang Da-yong.) (Scholars:王大勇) | Qi Fang (Qi Fang.)

Indexed by:

CPCI-S EI Scopus

Abstract:

Coast-down time measuring system can measure the time when speed values of Chassis Dynamometers for Automobile Emissions Testing change from initial velocity to end velocity under different load in a given speed range. This coast-down time will represent characters of Chassis Dynamometers for Automobile Emissions Testing such as Dynamometer inertia weight, constant load coast-down time, variable load coast-down time, Chassis Dynamometers for Automobile Emissions Testing can be calibrated by comparing these coast-down time with theoretical values. Working principle of coast-down time measuring system is a photoelectric sampler of coast-down time measuring system collects speed values information of Chassis Dynamometers for Automobile Emissions Testing. Then, determine speed values through calculation. When the velocity is equal to initial velocity V-b value, measuring system starts a timer. When speed reaches end velocity V-e value, measuring system stops the timer. So time interval is coast-down time from V-b to V-e. It is obvious that accuracy of coast-down time measurement lies on whether start and end velocity can be judged accurately and determined quickly, whether accuracy of timing can be admitted, and lies on how long these can be done. Coast-down time measuring system with photoelectric sampler proposed in this paper involves all the above factors, as well as improves measurement accuracy of coast-down time.

Keyword:

Photoelectric Sampler Coast-down Time Chassis Dynamometers for Automobile Emissions Testing Calibration

Author Community:

  • [ 1 ] [Zhu Wei-min]Beijing Univ Technol, Beijing 100026, Peoples R China
  • [ 2 ] [Wang Da-yong]Beijing Univ Technol, Beijing 100026, Peoples R China
  • [ 3 ] [Zhu Wei-min]Henan Inst Metrol, Zhengzhou 450008, Peoples R China
  • [ 4 ] [Qi Fang]Henan Inst Metrol, Zhengzhou 450008, Peoples R China

Reprint Author's Address:

  • [Zhu Wei-min]Beijing Univ Technol, Beijing 100026, Peoples R China

Email:

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Source :

5TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT

ISSN: 0277-786X

Year: 2010

Volume: 7656

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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