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作者:

Cheng, Guofeng (Cheng, Guofeng.) | Jiang, Zhuqing (Jiang, Zhuqing.) (学者:江竹青) | Wang, Dayong (Wang, Dayong.) (学者:王大勇) | Ding, Maoluan (Ding, Maoluan.) | Cui, Huakun (Cui, Huakun.)

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CPCI-S EI Scopus

摘要:

The single wavelength off-axis reflection digital holographic microscopy (DHM) can be applied in micron optical tomography measurement through the pre-magnification method. The pre-magnifying surface profile of the object is imaged by the lens placed in front of the object to be measured, and then is recorded by the CCD camera. The Reconstructed image can be got through Fresnel Diffraction calculation, the 3D surface shape information of the object was shown after the phase filtering and unwrapping process to the reconstruction image. The result in this experiment proves that off-axis reflection digital holographic microscopy can be applied to actual measurement of micron object, to achieve the tomography without touching or breaking the object.

关键词:

digital holographic microscopy Digital holography reflection

作者机构:

  • [ 1 ] [Cheng, Guofeng]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Jiang, Zhuqing]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Dayong]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Ding, Maoluan]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 5 ] [Cui, Huakun]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China

通讯作者信息:

  • [Cheng, Guofeng]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China

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来源 :

HOLOGRAPHY, DIFFRACTIVE OPTICS, AND APPLICATIONS IV

ISSN: 0277-786X

年份: 2010

卷: 7848

语种: 英文

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WoS核心集被引频次: 0

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