Transparent　thin　films　are　manufactured　by　PLD　(pulsed　laser　deposition)　in　different　oxygen　pressure.　The　various　property　of　samples　is　measured　by　Atomic　Force　Microscope　(AFM).　X-ray　diffraction　(XRD)　and　optical　transmission　spectrum.　All　samples　retain　the　original　structure　in　wurtzite　lattice　by　XRD,　there　is　not　being　of　metallic　cobalt　or　other　impurity　phase　with　the　limit　detection.　The　surface　morphology　of　the　films　observes　the　smoother　than　that　in　undoped　ZnO　thin　film.　The　transparency　of　thin　films　has　altered　greatly　with　the　different　oxygen　pressure　or　not　by　PLD,　which　is　shown　that　the　oxygen　pressure　has　impacted　on　the　transparency　of　the　film　and　surface　morphology.　And　UV-visible　spectra　fully　have　been　demonstrated　the　presence　of　Co2+　to　substitute　for　Zn2+　in　the　films　with　the　different　oxygen　pressure.