Nanowires　and　nanofilms　are　fundamental　building　blocks　of　micro　and　nano-electronics　for　both　of　bottom-up　and　top-down　technologies.　Monitoring　and　recording　the　mechanical　property　dynamics　at　atomic　scale　are　important　to　understand　the　atomic　mechanism　of　new　and　surprising　nano-phenomena　and　design　new　applications.　Through　years＇　endeavors,　we　developed　tensile　and/or　bending　in-situ　atomic-lattice　resolution　electron　microscopy　methods　and　equipments　for　nanowires　and　successfully　conducted　atomic-lattice　resolution　mechanical　tests　on　individual　nano-objects.　With　this,　we　observed　the　brittle　materials　SiC　and　Si　nanowires　(NWs)　become　highly　ductile　at　room　temperature.　The　crystalline　structural　evolution　processes　corresponding　to　the　occurrence　of　unusual　large　strain　plasticity　includes　the　dislocation　initiation,　dislocation　accumulation　and　amorphorization　as　well　as　the　necking　of　the　one　dimensional　nanowires　were　fully　recorded　at　atomic　scale　and　in　real　time.　We　also　expand　the　experimental　methods　and　equipments　to　two-dimensional　nanofilms.　An　example　of　tensile　experiment　on　nano-crystalline　Au　films　is　presented.　The　deformation　mechanisms　of　nano-crystalline　gold　films　were　observed　at　the　atomic　scale　and　real-time.　At　the　mean　time,　an　atomic　scale　the　crack　blunting　behavior　was　captured　and　the　plastic　deformation　mechanism　of　the　single　nano-crystalline　was　revealed.