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作者:

Wang, Jinhui (Wang, Jinhui.) | Wu, Wuchen (Wu, Wuchen.) (学者:吴武臣) | Gong, Na (Gong, Na.) | Zhang, Wang (Zhang, Wang.) | Hou, Ligang (Hou, Ligang.)

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摘要:

Using multiple-parameter Monte Carlo method, the effectiveness of the dual threshold voltage technique (DTV) in low power domino logic design is analyzed. Simulation results indicate that under significant temperature and process variations, DTV is still highly effective to reduce the total leakage and active power consumption for domino gates with speed loss. Also, regarding power and delay characteristics, different structure domino gates with DTV have different robustness against the temperature and process variation(1).

关键词:

effectiveness domino gate temperature and process variation

作者机构:

  • [ 1 ] [Wang, Jinhui]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 2 ] [Wu, Wuchen]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 3 ] [Zhang, Wang]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 4 ] [Hou, Ligang]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 5 ] [Gong, Na]Hebei Univ, Coll Elect & Info Engn, Baoding 071002, Peoples R China

通讯作者信息:

  • [Wang, Jinhui]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China

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来源 :

2009 IEEE 8TH INTERNATIONAL CONFERENCE ON ASIC, VOLS 1 AND 2, PROCEEDINGS

年份: 2009

页码: 1236-,

语种: 英文

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