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作者:

Zhang, Guangchen (Zhang, Guangchen.) | Feng, Shiwei (Feng, Shiwei.) (学者:冯士维) | Wang, Lu (Wang, Lu.) | Guo, Chunsheng (Guo, Chunsheng.) | Xie, Xuesong (Xie, Xuesong.) | Ge, Chenning (Ge, Chenning.)

收录:

CPCI-S

摘要:

In this paper, thermal management of the multi-chip vertical packaged (MCVP) white LED is presented. The steady state thermal resistance (RT) and thermal resistance constitution is obtained by transient response testing based on electrical method. R-T is 10.37 degrees C /W. The chips and package body contributes 2.63 degrees C /W and 7.74 degrees C /W respectively. The temperature distribution of the MCVP LED is obtained by 3-dimensional finite element method (FEM) simulation. By comparing heating response curves among different package forms' LED samples, the MCVP sample shares lowest steady state temperature rise with the metal alloyed substrate sample, which is lower than 18.3 degrees C of the single flip-chip sub-mounted device (SMD) sample and 15.3 degrees C of the multi-chip horizontal packaged (MCHP) sample.

关键词:

LED multi-chip reliability thermal resistance

作者机构:

  • [ 1 ] [Zhang, Guangchen]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Feng, Shiwei]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Lu]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Guo, Chunsheng]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Xie, Xuesong]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 6 ] [Ge, Chenning]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

通讯作者信息:

  • [Zhang, Guangchen]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

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来源 :

2009 SYMPOSIUM ON PHOTONICS AND OPTOELECTRONICS (SOPO 2009)

年份: 2009

页码: 662-665

语种: 英文

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