An　approach　for　forecasting　the　leakage　power　and　the　delay　of　the　dual　threshold　domino　OR　gates　based　on　Wavelet　Neural　Networks　(WNN)　in　45　nm　technology　is　proposed.　The　forecasting　system　has　fast　convergence　and　high　precision.　By　studying　the　impact　of　the　dual　threshold　voltage　technique　(DTV)　on　leakage　reduction　and　delay　increase,　it　successfully　forecasts　the　nonlinear　changing　of　the　leakage　power　and　delay　of　the　different　inputs　domino　OR　gates.　At　last,　the　reason　for　the　forecasting　error　and　the　trend　of　the　forecasting　curve　are　explained,　respectively.