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Author:

Zuo Lei (Zuo Lei.) | Wang Jinhui (Wang Jinhui.) | Hou Ligang (Hou Ligang.) | Geng Shuqin (Geng Shuqin.) | Wu Wuchen (Wu Wuchen.) (Scholars:吴武臣)

Indexed by:

CPCI-S EI Scopus

Abstract:

A fault diagnosis method for analog IC diagnosis based on wavelet neural network ensemble (WNNE) and Adaboost algorithm, is proposed in this paper. This makes the way of the directory be of use in fault, and enhances the validity of the fault diagnosis. Using wavelet decomposition as a tool for extracting feature, Then, after training the WNNE by faulty feature vectors, the model of the circuit with fault diagnosis system is built. Simulation results have shown that this claim is more effective than wavelet neural network (WNN).

Keyword:

Adaboos fault diaghosis WNNE

Author Community:

  • [ 1 ] [Zuo Lei]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 2 ] [Wang Jinhui]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 3 ] [Hou Ligang]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 4 ] [Geng Shuqin]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China
  • [ 5 ] [Wu Wuchen]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Zuo Lei]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China

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Source :

PROCEEDINGS OF THE 2009 WRI GLOBAL CONGRESS ON INTELLIGENT SYSTEMS, VOL IV

Year: 2009

Page: 45-48

Language: English

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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