• 综合
  • 标题
  • 关键词
  • 摘要
  • 学者
  • 期刊-刊名
  • 期刊-ISSN
  • 会议名称
搜索

作者:

Chen, Tao (Chen, Tao.) (学者:陈涛) | Zhang, Lin (Zhang, Lin.) | Wu, Jian (Wu, Jian.) | Liu, Shibing (Liu, Shibing.) (学者:刘世炳) | Zuo, Tiechuan (Zuo, Tiechuan.)

收录:

CPCI-S

摘要:

In this paper, we introduce a compact measuring system, to analyze microstructure force property. The system is specially designed in which a mechanical test machine, a PCB board based on an USB connection for device driving and data collection, and processing software were contained. This system can be used for measuring deformation characteristics of MEMS structures by bending method. To confirm the feasibility of the system, an experiment was performed on a micro pillar.

关键词:

material force property MEMS measurement USB-based system

作者机构:

  • [ 1 ] [Chen, Tao]Beijing Univ Technol, Inst Laser Engn, Beijing, Peoples R China
  • [ 2 ] [Zhang, Lin]Beijing Univ Technol, Inst Laser Engn, Beijing, Peoples R China
  • [ 3 ] [Wu, Jian]Beijing Univ Technol, Inst Laser Engn, Beijing, Peoples R China
  • [ 4 ] [Liu, Shibing]Beijing Univ Technol, Inst Laser Engn, Beijing, Peoples R China
  • [ 5 ] [Zuo, Tiechuan]Beijing Univ Technol, Inst Laser Engn, Beijing, Peoples R China

通讯作者信息:

  • 陈涛

    [Chen, Tao]Beijing Univ Technol, Inst Laser Engn, Beijing, Peoples R China

电子邮件地址:

查看成果更多字段

相关关键词:

相关文章:

来源 :

MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3

ISSN: 2474-3747

年份: 2008

页码: 5-8

语种: 英文

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

近30日浏览量: 2

在线人数/总访问数:807/2908482
地址:北京工业大学图书馆(北京市朝阳区平乐园100号 邮编:100124) 联系我们:010-67392185
版权所有:北京工业大学图书馆 站点建设与维护:北京爱琴海乐之技术有限公司