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作者:

Liu, Huaifu (Liu, Huaifu.) | Mo, Xiaohuan (Mo, Xiaohuan.)

收录:

SCIE

摘要:

In this paper, we study locally projectively flat Finsler metrics of constant flag curvature. We find equations that characterize these metrics by warped product. Using the obtained equations, we manufacture new locally projectively flat Finsler warped product metrics of vanishing flag curvature. These metrics contain the metric introduced by Berwald and the spherically symmetric metric given by Mo-Zhu.

关键词:

Finsler warped product metric Flag curvature Locally projectively flat Spherically symmetric

作者机构:

  • [ 1 ] [Liu, Huaifu]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Mo, Xiaohuan]Peking Univ, Sch Math Sci, Key Lab Pure & Appl Math, Beijing 100871, Peoples R China

通讯作者信息:

  • [Mo, Xiaohuan]Peking Univ, Sch Math Sci, Key Lab Pure & Appl Math, Beijing 100871, Peoples R China

电子邮件地址:

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相关关键词:

来源 :

JOURNAL OF GEOMETRIC ANALYSIS

ISSN: 1050-6926

年份: 2021

期: 11

卷: 31

页码: 11471-11492

1 . 1 0 0

JCR@2022

ESI学科: MATHEMATICS;

ESI高被引阀值:5

被引次数:

WoS核心集被引频次: 3

SCOPUS被引频次: 7

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

近30日浏览量: 5

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