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作者:

Wu Xinyu (Wu Xinyu.) | Suo Hongli (Suo Hongli.) (学者:索红莉) | Li Jiazhi (Li Jiazhi.) | Ji Yaotang (Ji Yaotang.) | Ma Lin (Ma Lin.) | Liu Min (Liu Min.) | Dai Yinming (Dai Yinming.) | Liu Jianhua (Liu Jianhua.) | Zhang Zili (Zhang Zili.)

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SCIE PubMed

摘要:

The microstructure and texture evolution of Ni-5 at%W (Ni5W) alloy substrates were investigated by in situ tensile testing along the rolling direction (RD), transverse direction (TD), and at 45° to the RD (45°-RD), as well as by electron backscatter diffraction characterization. The tensile stress direction had a significant influence on the texture evolution. The cubic texture in the Ni-5 at%W alloy exhibited severe degradation when the tensile angle was 45°-RD. In contrast, the cubic texture was relatively stable under high deformation along the RD or TD. It was found that the slip line system in the 45°-RD specimen was the key to the contrasting behavior. The effect of the tensile testing angle on the cubic texture evolution for Ni–W substrates was investigated, and the corresponding effect on the superconducting properties of coated materials was studied.

关键词:

coated conductor cubic texture electron backscatter diffraction plastic deformation

作者机构:

  • [ 1 ] [Wu Xinyu]Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing100124, China
  • [ 2 ] [Suo Hongli]Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing100124, China
  • [ 3 ] [Li Jiazhi]Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing100124, China
  • [ 4 ] [Ji Yaotang]Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing100124, China
  • [ 5 ] [Ma Lin]Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing100124, China
  • [ 6 ] [Liu Min]Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing100124, China
  • [ 7 ] [Dai Yinming]Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing100190, China
  • [ 8 ] [Liu Jianhua]Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing100190, China
  • [ 9 ] [Zhang Zili]Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing100190, China

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来源 :

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

ISSN: 1435-8115

年份: 2021

期: 1

卷: 27

页码: 36-43

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 1

ESI高被引论文在榜: 0 展开所有

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