Probabilistic Analysis for Sequential Circuits Verification Using Markov Chains - 文章详情页

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摘要：

Random　testing　is　used　extensively　in　functional　verification　of　hardware　systems.　In　practice,　testing　stops　when　a　certain　coverage　criterion　is　achieved.　However,　testing　has　the　inherent　problem　of　being　only　able　to　expose　bugs,　not　prove　their　absence.　Thus,　proving　whether　a　potential　bug　exists　or　not　under　current　verification　efforts　would　be　helpful　to　measure　the　completeness　of　testing.　This　brief　proposes　a　probabilistic　coverage　analysis　method　to　quantify　the　probability　of　bug　existence　for　sequential　circuit　verification　under　random　testing.　The　proposed　method　consists　of　an　effective　formula　for　computing　the　probability　of　a　bug　(assuming　it　exists)　being　detected　in　a　sequential　circuit.　The　formula　is　time　complexity　cubic　to　the　number　of　coverage　bins　and　linear　to　the　number　of　test　cycles.　To　validate　the　proposed　method,　it　was　implemented　in　MATLAB　to　calculate　the　probability　of　a　bug　being　detected.　Experimental　results　on　20,116　random　instances　indicate　that,　using　Monte　Carlo　simulation,　the　proposed　analysis　method　has　an　average　absolute　relative　error　of　approximately　0.027%,　comparing　to　7.38%　in　existing　work.　©　2004-2012　IEEE.

关键词：

MATLAB Sequential circuits Markov chains Monte Carlo methods Timing circuits

作者机构：

[ 1 ] [Zhang, Mingming]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 2 ] [Geng, Shuqin]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 3 ] [Wang, Wensi]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 4 ] [Peng, Xiaohong]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 5 ] [Chu, Menghao]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 6 ] [Zhou, Shengyuan]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 7 ] [Zhang, Zhonghou]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 8 ] [Lu, Hang]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 9 ] [Li, Pengkun]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China
[ 10 ] [Zhu, Ronghao]Faculty of Information Technology, College of Electronic Science and Technology, Beijing University of Technology, Beijing; 100124, China

通讯作者信息：

[geng, shuqin]faculty of information technology, college of electronic science and technology, beijing university of technology, beijing; 100124, china

电子邮件地址：

gengshuqin@bjut.edu.cnemailwensi.wang@bjut.edu.cn) Wang, Wensi(wensi.wang@bjut.edu.cn

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