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Author:

Sha, Yong-Ping (Sha, Yong-Ping.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Xie, Hong-Yun (Xie, Hong-Yun.)

Indexed by:

CPCI-S EI Scopus

Abstract:

Considering the noise correlation term between collector and base current shot noise, there mainly are four noise parameter models of SiGe HBTs, including the unified noise model (UNI), two SPICE noise models (SPN1, SPN2), the thermodynamic noise model (TDN). A comparison of these modets was investigated in this work. A SiGe HBT based on BiCMOS process was fabricated and its S-parameters and Minimum Noise Figure were tested. Through the comparison between the measurement and the simulation results from these models, two of the models, the UNI and the SPN2, were obviously in good agreement with the measured results at high-frequency.

Keyword:

simulation noise correlation Heterojunction bipolar transistors HF amplifiers silicon

Author Community:

  • [ 1 ] [Sha, Yong-Ping]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China
  • [ 2 ] [Zhang, Wan-Rong]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China
  • [ 3 ] [Xie, Hong-Yun]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Sha, Yong-Ping]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

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Source :

2007 IEEE INTERNATIONAL WORKSHOP ON RADIO-FREQUENCY INTEGRATION TECHNOLOGY, PROCEEDINGS: ENABLING TECHNOLOGIES FOR EMERGING WIRELESS SYSTEMS

Year: 2007

Page: 202-205

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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