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作者:

Sha, Yong-Ping (Sha, Yong-Ping.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Xie, Hong-Yun (Xie, Hong-Yun.)

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CPCI-S EI Scopus

摘要:

Considering the noise correlation term between collector and base current shot noise, there mainly are four noise parameter models of SiGe HBTs, including the unified noise model (UNI), two SPICE noise models (SPN1, SPN2), the thermodynamic noise model (TDN). A comparison of these modets was investigated in this work. A SiGe HBT based on BiCMOS process was fabricated and its S-parameters and Minimum Noise Figure were tested. Through the comparison between the measurement and the simulation results from these models, two of the models, the UNI and the SPN2, were obviously in good agreement with the measured results at high-frequency.

关键词:

correlation Heterojunction bipolar transistors HF amplifiers noise silicon simulation

作者机构:

  • [ 1 ] [Sha, Yong-Ping]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China
  • [ 2 ] [Zhang, Wan-Rong]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China
  • [ 3 ] [Xie, Hong-Yun]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

通讯作者信息:

  • [Sha, Yong-Ping]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

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来源 :

2007 IEEE INTERNATIONAL WORKSHOP ON RADIO-FREQUENCY INTEGRATION TECHNOLOGY, PROCEEDINGS: ENABLING TECHNOLOGIES FOR EMERGING WIRELESS SYSTEMS

年份: 2007

页码: 202-205

语种: 英文

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