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Author:

Feng, Shoubo (Feng, Shoubo.) | Wang, Jinhui (Wang, Jinhui.) | Feng, Zhe (Feng, Zhe.) | Zhang, Han (Zhang, Han.) | Wu, Wuchen (Wu, Wuchen.) (Scholars:吴武臣)

Indexed by:

CPCI-S

Abstract:

ADC modules play an important role in electronic measurement systems, and comparators are the core components of ADCs. Comparator properties, especially offset voltage, have an essential effect on the accuracy of ADCs, and then affect accuracy of the system. An implementation of low offset latched comparator is presented by this paper, which could decrease the offset tremendously.

Keyword:

ADC latch offset comparator

Author Community:

  • [ 1 ] Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Feng, Shoubo]Beijing Univ Technol, VLSI & Syst Lab, Beijing 100022, Peoples R China

Email:

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Source :

2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS

Year: 2007

Page: 2073-2076

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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