Systematic research on the effect of both positive and negative mismatch dopants in double-doped YBCO superconducting films - 文章详情页

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摘要：

We　report　a　novel　doping　strategy　for　YBa2Cu3O7-x　(YBCO)　superconducting　films　by　using　a　positive　mismatch,　Ba2YNbO6　(BYNO),　and　a　negative　mismatch,　LaAlO3　(LAO),　simultaneously.　Double　doping　can　significantly　reduce　the　c-strain　in　the　YBCO　film　by　canceling　the　strain　between　the　two　dopants.　By　systematically　optimizing　the　doping　amount　of　both　BYNO　and　LAO,　it　was　found　that　BYNO　and　LAO　do　not　act　equally.　The　microstructure　and　distribution　of　both　BYNO　and　LAO　were　investigated　with　magneto-optic　microscopy　and　scanning　electron　microscopy.　The　effect　of　BYNO　and　LAO　on　pinning　was　confirmed.　The　results　of　this　study　will　help　select　appropriate　positive　mismatch　and　negative　mismatch　dopants,　which　is　fundamental　to　the　design　and　fabrication　of　pinning　centers　to　fit　different　application　scenarios.　©　2020　Elsevier　Ltd

关键词：

Lanthanum compounds Semiconductor doping Copper compounds Yttrium barium copper oxides Aluminum compounds Superconducting films Niobium compounds Barium compounds Scanning electron microscopy

作者机构：

[ 1 ] [Xu, Yan]Beijing University of Technology, Beijing; 100124, China
[ 2 ] [Xu, Yan]Technical University of Denmark, Kgs Lyngby; 2800, Denmark
[ 3 ] [Suo, Hongli]Beijing University of Technology, Beijing; 100124, China
[ 4 ] [Qureishy, Thomas]Department of Physics, University of Oslo, P. O. Box 1048 Blindern, Oslo; 0316, Norway
[ 5 ] [Grivel, Jean-Claude]Technical University of Denmark, Kgs Lyngby; 2800, Denmark
[ 6 ] [Mikheenko, Pavlo]Department of Physics, University of Oslo, P. O. Box 1048 Blindern, Oslo; 0316, Norway
[ 7 ] [Liu, Min]Beijing University of Technology, Beijing; 100124, China
[ 8 ] [Ma, Lin]Beijing University of Technology, Beijing; 100124, China
[ 9 ] [Zhang, Xiaolong]Beijing University of Technology, Beijing; 100124, China
[ 10 ] [Zhou, Yuqi]Beijing University of Technology, Beijing; 100124, China
[ 11 ] [Liu, Jianhua]Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing; 100190, China
[ 12 ] [Wang, Lei]Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing; 100190, China
[ 13 ] [Zhang, Zili]Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing; 100190, China
[ 14 ] [Wang, Qiuliang]Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing; 100190, China
[ 15 ] [Wang, Qiuliang]University of Chinese Academy of Sciences, Beijing; 100049, China

通讯作者信息：

索红莉
[suo, hongli]beijing university of technology, beijing; 100124, china

电子邮件地址：

honglisuo@bjut.edu.cn

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