• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Liu, Wei (Liu, Wei.) | Li, Zhuxin (Li, Zhuxin.) | Xing, Cheng (Xing, Cheng.) | Wang, Ru (Wang, Ru.) | Zhu, Yizhi (Zhu, Yizhi.) | Shi, Zengliang (Shi, Zengliang.) | Yan, Yinzhou (Yan, Yinzhou.) (Scholars:闫胤洲) | Xu, Chunxiang (Xu, Chunxiang.)

Indexed by:

SCIE

Abstract:

Defect manipulation plays an important role in regulating luminescence efficiency and electric performance of wide bandgap semiconductor devices. ZnO possesses complex defects, resulting in a bottleneck for p-type doping due to self-compensation. In this article, we propose a strategy to manipulate the defects in ZnO microwires (MWs) via thermal-assisted UV-photon irradiation. With this strategy, the photoluminescence (PL) and electroluminescence (EL) of the near band edge emission are enhanced. The improvement in radiation efficiency is attributed to the recrystallization of the ZnO MWs, by which the oxygen vacancy and zinc interstitial defects are suppressed. The combination of UV photo-chemical and thermal quenching for defect regulation is confirmed, for the first time, by PL and EL spectra. The work provides insights into defect engineering for luminescence efficiency improvement in wide bandgap semiconductor devices.

Keyword:

Zinc oxide luminescence efficiency Radiation effects II-VI semiconductor materials Zinc Light emitting diodes ZnO microwires (MWs) Defect engineering thermal quenching UV irradiation Luminescence Crystallization

Author Community:

  • [ 1 ] [Liu, Wei]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China
  • [ 2 ] [Li, Zhuxin]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China
  • [ 3 ] [Wang, Ru]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China
  • [ 4 ] [Zhu, Yizhi]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China
  • [ 5 ] [Shi, Zengliang]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China
  • [ 6 ] [Xu, Chunxiang]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China
  • [ 7 ] [Xing, Cheng]Beijing Univ Technol, Inst Laser Engn, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 8 ] [Yan, Yinzhou]Beijing Univ Technol, Inst Laser Engn, Fac Mat & Mfg, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 闫胤洲

    [Shi, Zengliang]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China;;[Xu, Chunxiang]Southeast Univ, Sch Biol Sci & Med Engn, State Key Lab Bioelect, Nanjing 210096, Peoples R China;;[Yan, Yinzhou]Beijing Univ Technol, Inst Laser Engn, Fac Mat & Mfg, Beijing 100124, Peoples R China

Show more details

Related Keywords:

Source :

IEEE TRANSACTIONS ON ELECTRON DEVICES

ISSN: 0018-9383

Year: 2021

Issue: 7

Volume: 68

Page: 3283-3289

3 . 1 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:87

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 7

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

Online/Total:745/5309216
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.