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Author:

He, Baofeng (He, Baofeng.) | Zheng, Haibo (Zheng, Haibo.) | Ding, Siyuan (Ding, Siyuan.) | Yang, Ruizhao (Yang, Ruizhao.) | Shi, Zhaoyao (Shi, Zhaoyao.) (Scholars:石照耀)

Indexed by:

EI Scopus SCIE

Abstract:

Surface roughness is an important indicator in the evaluation of machining and product quality, as well as a direct factor affecting the performance of components. A rapidly developing filtering technology has become the main means of extracting surface roughness. The International Organization for Standardization (ISO) is constantly updating and improving the standard system for filtering technology in order to meet the requirements of technological development. Based on the filters already accepted by the international standard ISO 16610, this study briefly introduces the filtering principle of each filter, reviews the development of each filter in the application of surface roughness, and compares the advantages and limitations of their individual performances. The application range of each filter is summarized and, finally, the future direction of the digital filtering used in surface roughness is extrapolated.

Keyword:

surface engineering surface roughness profile filtering areal filtering

Author Community:

  • [ 1 ] [He, Baofeng]Beijing Univ Technol, Fac Mat & Mfg, Beijing Engn Res Ctr Precis Measurement Technol &, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 2 ] [Zheng, Haibo]Beijing Univ Technol, Fac Mat & Mfg, Beijing Engn Res Ctr Precis Measurement Technol &, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 3 ] [Ding, Siyuan]Beijing Univ Technol, Fac Mat & Mfg, Beijing Engn Res Ctr Precis Measurement Technol &, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 4 ] [Yang, Ruizhao]Beijing Univ Technol, Fac Mat & Mfg, Beijing Engn Res Ctr Precis Measurement Technol &, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 5 ] [Shi, Zhaoyao]Beijing Univ Technol, Fac Mat & Mfg, Beijing Engn Res Ctr Precis Measurement Technol &, 100 Ping Le Yuan, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [He, Baofeng]Beijing Univ Technol, Fac Mat & Mfg, Beijing Engn Res Ctr Precis Measurement Technol &, 100 Ping Le Yuan, Beijing 100124, Peoples R China

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Source :

METROLOGY AND MEASUREMENT SYSTEMS

ISSN: 0860-8229

Year: 2021

Issue: 2

Volume: 28

Page: 217-253

1 . 0 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:72

JCR Journal Grade:4

Cited Count:

WoS CC Cited Count: 25

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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