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作者:

Dong, Yibo (Dong, Yibo.) | Guo, Sheng (Guo, Sheng.) | Mao, Huahai (Mao, Huahai.) | Xu, Chen (Xu, Chen.) (学者:徐晨) | Xie, Yiyang (Xie, Yiyang.) | Deng, Jun (Deng, Jun.) | Wang, Le (Wang, Le.) | Du, Zaifa (Du, Zaifa.) | Xiong, Fangzhu (Xiong, Fangzhu.) | Sun, Jie (Sun, Jie.)

收录:

SCIE

摘要:

A technique for the in situ growth of patterned graphene by CVD has been achieved directly on insulating substrates at 800 degrees C. The graphene growth is catalyzed by a Ni-Cu alloy sacrificial layer, which integrates many advantages such as being lithography-free, and almost wrinkle-free, with a high repeatability and rapid growth. The etching method of the metal sacrificial layer is the core of this technique, and the mechanism is analyzed. Graphene has been found to play an important role in accelerating etching speeds. The Ni-Cu alloy exhibits a high catalytic activity, and thus, high-quality graphene can be obtained at a lower temperature. Moreover, the Ni-Cu layer accommodates a limited amount of carbon atoms, which ensures a high monolayer ratio of the graphene. The carbon solid solubility of the alloy is calculated theoretically and used to explain the experimental findings. The method is compatible with the current semiconductor process and is conducive to the industrialization of graphene devices.

关键词:

chemical vapor deposition graphene in situ growth insulating substrate lithography-free

作者机构:

  • [ 1 ] [Dong, Yibo]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Xu, Chen]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Xie, Yiyang]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Deng, Jun]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Wang, Le]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Du, Zaifa]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Xiong, Fangzhu]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Sun, Jie]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 9 ] [Guo, Sheng]Chalmers Univ Technol, Dept Ind & Mat Sci, S-41296 Gothenburg, Sweden
  • [ 10 ] [Sun, Jie]Chalmers Univ Technol, Quantum Device Phys Lab, Dept Microtechnol & Nanosci, S-41296 Gothenburg, Sweden
  • [ 11 ] [Mao, Huahai]KTH Royal Inst Technol, LiMat Sci & Engn, Brinellvagen 23, SE-10044 Stockholm, Sweden
  • [ 12 ] [Mao, Huahai]Thermocalc Software AB, Rasundavagen 18, S-16967 Solna, Sweden

通讯作者信息:

  • 徐晨 孙捷

    [Xu, Chen]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China;;[Sun, Jie]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China

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来源 :

ACS APPLIED ELECTRONIC MATERIALS

ISSN: 2637-6113

年份: 2020

期: 1

卷: 2

页码: 238-246

4 . 7 0 0

JCR@2022

JCR分区:2

被引次数:

WoS核心集被引频次: 16

SCOPUS被引频次: 18

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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