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Author:

Hao, Molei (Hao, Molei.) | Bao, Jianfeng (Bao, Jianfeng.) | Dai, Jingjing (Dai, Jingjing.) | Wang, Zhiyong (Wang, Zhiyong.) (Scholars:王智勇)

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CPCI-S EI Scopus

Abstract:

In the field of laser engineering, various beam quality criterion has poor scalability, and the description of the laser spot is blurry. Most of the already published spot quality analyses focus on the uniformity of the laser spot, without considering the laser spot features. A generally applicable evaluation system has not been established. Follow standardization thinking, an ideal reference spot model was established, and an evaluation method of laser spot quality was proposed. With substituting simulation and experimental images into calculations, it is confirmed that this method can eliminate the interference from spot picture inherent attributes like the number of pixels, size, and luminance. This method makes the spots of various lasers measurable, especially be appropriate for evaluating semiconductor laser spot, multi-mode fiber spot where the beam quality is insufficient.

Keyword:

spot quality Beam quality gray scale pixel uniformity

Author Community:

  • [ 1 ] [Hao, Molei]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China
  • [ 2 ] [Bao, Jianfeng]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China
  • [ 3 ] [Dai, Jingjing]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China
  • [ 4 ] [Wang, Zhiyong]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China

Reprint Author's Address:

  • 王智勇

    [Dai, Jingjing]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China;;[Wang, Zhiyong]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China

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Source :

24TH NATIONAL LASER CONFERENCE & FIFTEENTH NATIONAL CONFERENCE ON LASER TECHNOLOGY AND OPTOELECTRONICS

ISSN: 0277-786X

Year: 2020

Volume: 11717

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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