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作者:

Hao, Molei (Hao, Molei.) | Bao, Jianfeng (Bao, Jianfeng.) | Dai, Jingjing (Dai, Jingjing.) | Wang, Zhiyong (Wang, Zhiyong.) (学者:王智勇)

收录:

CPCI-S

摘要:

In the field of laser engineering, various beam quality criterion has poor scalability, and the description of the laser spot is blurry. Most of the already published spot quality analyses focus on the uniformity of the laser spot, without considering the laser spot features. A generally applicable evaluation system has not been established. Follow standardization thinking, an ideal reference spot model was established, and an evaluation method of laser spot quality was proposed. With substituting simulation and experimental images into calculations, it is confirmed that this method can eliminate the interference from spot picture inherent attributes like the number of pixels, size, and luminance. This method makes the spots of various lasers measurable, especially be appropriate for evaluating semiconductor laser spot, multi-mode fiber spot where the beam quality is insufficient.

关键词:

Beam quality gray scale pixel spot quality uniformity

作者机构:

  • [ 1 ] [Hao, Molei]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China
  • [ 2 ] [Bao, Jianfeng]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China
  • [ 3 ] [Dai, Jingjing]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China
  • [ 4 ] [Wang, Zhiyong]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China

通讯作者信息:

  • 王智勇

    [Dai, Jingjing]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China;;[Wang, Zhiyong]Beijing Univ Technol, Inst Adv Technol Semicond Opt & Elect, Beijing 100020, Peoples R China

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来源 :

24TH NATIONAL LASER CONFERENCE & FIFTEENTH NATIONAL CONFERENCE ON LASER TECHNOLOGY AND OPTOELECTRONICS

ISSN: 0277-786X

年份: 2020

卷: 11717

语种: 英文

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