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Author:

Lee Yungchun (Lee Yungchun.) | Zhang Binpeng (Zhang Binpeng.) | Lv Yan (Lv Yan.) | Song Guorong (Song Guorong.) | He Cunfu (He Cunfu.) (Scholars:何存富)

Indexed by:

CPCI-S

Abstract:

Cavity method is widely used in microwave measurement of electromagnetic properties. In this paper, a new double-ridged cavity method is proposed, which can enhance the operational frequency bandwidth. Building on the perturbation theory, the measurement equations required for permittivity and permeability extraction are developed. And for obtaining the electromagnetic properties more accurately, a calibration method is introduced to calibrate the shape factors. The proposed method is first simulated using the High Frequency Structure Simulator (HFSS) to demonstrate the linear relationship between the resonant parameters and the electromagnetic properties. Thereafter, a series of standard samples are also tested and verified by using the numerical simulator. For comparison the reference data, the calibration method can obviously improve the accuracy of electromagnetic parameters, especially the imag part error of complex permeability, which is reduced from more than 60% to about 4%.

Keyword:

double-ridged cavity shape factor electromagnetic properties calibration method

Author Community:

  • [ 1 ] [Lee Yungchun]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang Binpeng]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Lv Yan]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Song Guorong]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [He Cunfu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Lv Yan]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

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Source :

PROCEEDINGS OF 2019 14TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI)

Year: 2019

Page: 274-278

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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