In　this　work,　high-quality　(Ca1-xBix)(Mo1-xVx)O-4　(0.15　＜=　x　＜=　0.5)　ceramics　with　a　tetragonal　scheelite　structure　were　prepared　at　sintering　temperatures　of　800-925　degrees　C.　Their　microstructures,　alternating　current　impedance,　and　microwave　dielectric　properties　were　studied　comprehensively.　Through　scanning　electron　microscopy　and　transmission　electron　microscopy　analyses,　the　low-temperature　sintering　mechanism　was　clarified　to　be　the　dissolution-precipitation　process　of　small　particles　in　the　liquid　phase　of　the　grain　boundary.　The　increase　in　point　defects　led　to　an　increase　in　extrinsic　loss,　which　might　be　the　main　ex-trinsic　factor　affecting　the　Qxf　(Q　=　quality　factor　=　1/dielectric　loss,　f　=　resonant　frequency)　value.　The　(Ca0.65Bi0.35)(Mo0.65V0.35)O-4　ceramic　sintered　at　875　degrees　C　for　4　h　exhibited　superior　microwave　dielectric　properties,　with　permittivity　(epsilon(r))　similar　to　17,　Qxf　value　similar　to　12080　GHz　(at　9.86　GHz),　and　near-zero　temperature　coefficient　of　resonance　frequency　(tau(f))　similar　to　+　3.6　ppm/degrees　C;　thus,　the　ceramic　has　great　potential　for　the　LTCC　application.　(C)　2021　Elsevier　B.V.　All　rights　reserved.