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作者:

Yan, J. W. (Yan, J. W..) | Zhang, W. (Zhang, W..) (学者:张伟)

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EI Scopus SCIE

摘要:

In this paper, we employ the atomistic-continuum method to open a new way to precisely measure the thickness of one-atomic material. The wall thickness of graphene is exactly extracted to be 0.0739 nm by fitting the first eight natural frequencies of a series of simply-supported graphene using atomistic-continuum method with classical plate theory. The Young's modulus and bending rigidity are determined to be 3.1851 TPa and 0.8066 eV. By using this thickness, the free vibration studies of clamped case, which removes the effect of dangling bonds, by the atomistic-continuum method, molecular mechanics and classical plate theory are found to be in a good agreement, confirming its accuracy. Inherited it to the hollow tubular structure, it is found that both Timoshenko and Euler-Bernoulli beam models also give a quite close prediction of carbon nanotubes as compared with molecular mechanics. This means the discrepancy between atomic simulation and continuum mechanics is no other than the unreal wall thickness. Besides, the usage of scale parameter and its value is also discussed.

关键词:

Timoshenko beam Plate theory Atomistic-continuum CNT Material thickness Free vibration Graphene

作者机构:

  • [ 1 ] [Yan, J. W.]Beijing Univ Technol, Coll Mech Engn, Beijing Key Lab Nonlinear Vibrat & Strength Mech, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang, W.]Beijing Univ Technol, Coll Mech Engn, Beijing Key Lab Nonlinear Vibrat & Strength Mech, Beijing 100124, Peoples R China
  • [ 3 ] [Yan, J. W.]East China Jiaotong Univ, Engn Res & Dev Ctr Underground Technol Jiangxi Pr, Sch Civil Engn & Architecture, Nanchang 330013, Jiangxi, Peoples R China

通讯作者信息:

  • 张伟

    [Zhang, W.]Beijing Univ Technol, Coll Mech Engn, Beijing Key Lab Nonlinear Vibrat & Strength Mech, Beijing 100124, Peoples R China

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来源 :

JOURNAL OF SOUND AND VIBRATION

ISSN: 0022-460X

年份: 2021

卷: 514

4 . 7 0 0

JCR@2022

ESI学科: ENGINEERING;

ESI高被引阀值:87

JCR分区:1

被引次数:

WoS核心集被引频次: 14

SCOPUS被引频次: 19

ESI高被引论文在榜: 0 展开所有

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