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Abstract:
Insect pest is one of the main causes affecting agricultural crop yield and quality all over the world. Rapid and reliable insect pest monitoring plays a crucial role in population prediction and control actions. The great breakthrough of deep learning (DL) technology has resulted in its successful applications in various fields, including automatic insect pest monitoring. DL creates both new strengths and a series of challenges for data processing in smart pest monitoring (SPM). This review outlines the technical methods of DL frameworks and their applications in SPM with emphasis on insect pest classification and detection using field images. The methodologies and technical details evolved in insect pest classification and detection using DL are summarized and distilled during different processing stages: image acquisition, data preprocessing and modeling techniques. Finally, a general framework is provided to facilitate the smart insect monitoring and future challenges and trends are highlighted. In a word, our purpose is to provide researchers and technicians with a better understanding of DL techniques and their state-of-art achievements in SPM, which can promote the implement of various SPM applications.
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Source :
ECOLOGICAL INFORMATICS
ISSN: 1574-9541
Year: 2021
Volume: 66
5 . 1 0 0
JCR@2022
ESI Discipline: ENVIRONMENT/ECOLOGY;
ESI HC Threshold:94
JCR Journal Grade:2
Cited Count:
WoS CC Cited Count: 100
SCOPUS Cited Count: 131
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 0
Affiliated Colleges: