High-quality　polycrystalline　Cd1-xZnxTe　(0　＜　x　＜　1)　thin　films　were　deposited　on　soda-lime　glass　substrates　by　the　thermal　evaporation　technique　using　a　single　source.　The　Structural,　optical,　and　electrical　properties　of　CZT　thin　films　were　investigated　by　XRD,　SEM,　EDX,　UV/VIS/NIR　spectrophotometer,　Keithly　source　meter　2410-C　and　multimeter　2010.　The　X-ray　diffraction　reveals　that　CZT　thin　films　are　polycrystalline　with　predominant　diffraction　along　the　(1　1　1)　plane.　The　Swanepoel　method　is　used　to　calculate　the　optical　constant　of　thin　films.　It　was　found　that　the　refractive　index　increases　and　transmittance　decreased　with　an　increase　in　Zn　content.　The　CZT　thin　films　have　a　direct　band-gap　and　ranging　from　1.62　to　2.06　eV　with　varying　Zn　content.　Current-Voltage　measurements　showed　that　the　photocurrent　of　these　thin　films　is　increasing　as　the　Zn　content　is　increased.