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作者:

Zhang, Zili (Zhang, Zili.) | Wang, Kangshuai (Wang, Kangshuai.) | Wang, Xufeng (Wang, Xufeng.) | Chen, Shunzhong (Chen, Shunzhong.) | Suo, Hongli (Suo, Hongli.) (学者:索红莉) | Ma, Lin (Ma, Lin.) | Liu, Jianhua (Liu, Jianhua.) | Wang, Lei (Wang, Lei.) | Wang, Qiuliang (Wang, Qiuliang.)

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EI Scopus SCIE

摘要:

Although all the commercial REBCO tapes claim the stabilizer layer is pure Cu, the turn-to-turn contact resistance of coils wound from conductors sourced from different manufacturers may have a difference of more than an order of magnitude. The Cu layer in the REBCO tape with high contact resistance has a less dense microstructure and a higher impurity chemical compound such as oxide and carbide after systematically investigating. Such a phenomenon can reveal a possible new partial insulation strategy that the contact resistance could be increased without further co-winded with other materials by adjusting the microstructure and chemical composition in the Cu layer. Increasing the contact resistance with no co-winded with other materials will decrease the charging decay rate and not sacrifice the Je value, which has application potential in the extremely high field superconducting magnets.

关键词:

REBCO coil Contact resistance Non-insulated coils Cu layer Chemical composition

作者机构:

  • [ 1 ] [Zhang, Zili]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 2 ] [Wang, Kangshuai]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 3 ] [Chen, Shunzhong]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 4 ] [Liu, Jianhua]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 5 ] [Wang, Lei]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 6 ] [Wang, Qiuliang]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 7 ] [Wang, Kangshuai]Univ Chinese Acad Sci, Beijing 100049, Peoples R China
  • [ 8 ] [Wang, Qiuliang]Univ Chinese Acad Sci, Beijing 100049, Peoples R China
  • [ 9 ] [Wang, Xufeng]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 10 ] [Suo, Hongli]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 11 ] [Ma, Lin]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China

通讯作者信息:

  • [Wang, Lei]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China;;[Wang, Qiuliang]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China

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来源 :

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS

ISSN: 0921-4534

年份: 2021

卷: 590

1 . 7 0 0

JCR@2022

ESI学科: PHYSICS;

ESI高被引阀值:72

JCR分区:4

被引次数:

WoS核心集被引频次: 11

SCOPUS被引频次: 12

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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